Principle

Approaching a sharp silicon tip mounted on a cantilever to a sample surface leads to an atomic scale interaction. The result is a bend of the cantilever which is detected by a laser. In static mode the resulting deflection is used to investigate the topography of the sample surface line by line using a feedback loop. In dynamic mode the cantilever is oscillated at fixed frequency resulting in a damped amplitude near the surface. The measurement parameters (setpoint, feedback gain) play a crucial role for image quality. Their effect on the imaging quality is investigated for different nano structured samples.

Benefits


Investigation in static and dynamic mode

Modification of numerous parameters to optimize image quality

Perform experiment with different samples

Excellent price-performance ratio

Custom-designed for use in teaching labs

Microscope consists of one compact, portable instrument, no additional instruments required

Vibration isolated for better and reproducible results


Tasks


Learn how to mount a cantilever (with tip) and approach the tip towards a sample.

Investigate the influence of the scanning parameters on the imaging quality and performance, e.g. PID gain, setpoint (force), vibrational amplitude, and scanning speed. Use both static and dynamic force mode.

Image different samples (microstructures, carbon nano tubes, skin cross-section, bacteria, CD stamper, chip structure, glass beads) by optimizing the parameters respectively.


What you can learn about


Atomic Force Microscopy (AFM)

Lennard-Jones potential

Imaging of nano structures

Static Force Mode

Dynamic Force Mode

Feedback loop

Force

Vibrational amplitude


Software included. Computer not provided.