Principle

Various metal samples are subjected to polychromatic X-rays. The
resulting fluorescence radiation is analysed with the aid of a
semiconductor detector and a multichannel analyser. The energy of
the characteristic X-ray lines and their full widths at half
maximum are determined. In addition, the dependence of the full
widths at half maximum and the shift of the line centroid as a
function of the counting rate are examined.

Tasks


Calibration of the semiconductor detector with the aid of the
characteristic radiation of the molybdenum X-ray tube.

Recording of the spectra of the fluorescence radiation that is
generated by the metal samples.

Determination of the energy levels and full widths at half
maximum of the characteristic Kα lines and their graphical
representation.

Determination and graphical representation of the full widths
at half maximum as a function of the counting rate, with the Kα
line of zircon used as an example.

Determination and graphical representation of the shift of the
line centroid as a function of the counting rate, with the Kα line
of zircon used as an example.


What you can learn about


Bremsstrahlung

characteristic X-radiation

fluorescence radiation

conduction processes in semiconductors

doping of semiconductors

pin-diodes

resolution and resolving power

semiconductor energy

multi-channel analysers