Principle

Various metal samples are subjected to polychromatic X-rays. The
resulting fluorescence radiation is analysed with the aid of a
semiconductor detector and a multi-channel analyser. The maxima of
intensity of the corresponding characteristic X-ray lines are
determined. The predefined energy values of the characteristic
lines and channels of the multichannel analyser that must be
assigned in turn result in a calibration of the semiconductor
energy detector.

Tasks


Record the spectra of the fluorescence radiation that is
generated by the metal samples.

Determine the channel numbers of the maxima intensity of the
characteristic lines of the corresponding fluorescence
radiation.

Represent the predefined line energies as a function of the
channel numbers graphically for two gain factors of the
multichannel analyser.


What you can learn about


Bremsstrahlung

Characteristic X-radiation

Energy levels

Fluorescence radiation

Conduction processes in semiconductors

Doping of semiconductors

Pin-diodes

Semiconductor energy detectors

Multichannel analysers